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Публикации от 1 до 20 от общо 56
статия Arnaudov B, S. Evtimova. P. Docheva, I. Dermendjiev, G. Vassilev. Electrical properties of CuInSe2 Films Deposited by DC Magnetron Sputtering.// Annual School Lectures, 1999, No 2, pp. 26-30
статия Docheva P, A. Shopov. ITO films deposited by reactive D.C. Magnetron Sputtering using argon-oxygen-hydrogen atmosphere.// Известия на СУ – Русе, 2002, No 3, pp. 83-90
статия Koukarenko E, G. Vassilev, N. Nancheva, P. Docheva, J. Tedenac, N.Freti. V. Shepelevich. Defects in Sb2-xBixTe3 foils.// Journal of Alloys and Compounds, 1999, No 287, pp. 239-242
статия Miettinen J., P. Docheva, G. Vassilev,. Thermodynamic description of the Cu–Pb–Sn system at the Cu–Pb side,.// Calphad, 2010, No 4, pp. 415-420
статия Nancheva N, P. Docheva, N. Djourelov, M. Balcheva. Positron and X-ray Diffraction Study of Cu-Se, In-Se and CuInSe2 Thin Films.// Materials Letters, 2002, No 64, pp. 169 – 174
статия Nancheva N, P. Docheva, N. Djourelov, M. Balcheva. Positron study of Cu-Se, In-Se and CuInSe2 Thin Films.// Materials Science Forum, 2001, No 363-365, pp. 147-149
статия Nancheva N, P. Docheva, M. Misheva. Effect of the Substrate Bias on the Structural Defects in SnOx Films.// Proc. Suppl. BPL, 1997, No 5, pp. 904-907
статия Nancheva N, P. Docheva, M. Misheva, N. Djourelov. A study of defect Structure of Sputter Deposited SnOx Films using the Doppler broadening of the Annihilation Line.// Bulg. J. Phys., 1998, No 3/4, pp. 171-176
статия Nancheva N, P. Docheva, N. Feschiev, M. Misheva, N. Djourelov. Defects in sputter-deposited Aluminium Films, studied by X-ray diffraction and positron annihilation.// Scripta Metallurgica et Materialia, 1995, No 4, pp. 575-581
статия Nancheva N, P. Docheva, P. Hadjijska, M. Misheva, N. Djourelov, D. Elenkov. Investigation of the effect of oxygen and substrate bias on the defect structure of sputter-deposited SnOx Films.// Scripta Materialia, 1997, No 12, pp. 1957-1962
статия Nancheva N, P. Docheva, W. Anwand, G. Brauer. Characterization of Sn Films on Silicon by Slow Positron Implantation Spectroscopy.// Acta Physica Polonica A, 2001, No 3-4, pp. 435-440
статия Nancheva N., P. Docheva, N. Djourelov. Effect of the Substrate Bias on the structural defects in copper films.// Известия на СУ – Русе, 2002, No 3, pp. 103-105
статия Nancheva, P. Docheva, M. Misheva. Defects in Cu and Cu-O films produced by Reactive Magnetron Sputtering.// Materials Letters, 1999, No 39, pp. 81-85
статия Nancheva, P.Docheva, W. Anwand, G. Brauer, P. Coleman. Magnetron Sputtered SnOx Films on Tin probed by Slow Positron Implantation Spectroscopy.// Acta Physica Polonica A, 1999, No 4, pp. 623-627
статия Popov D, P. Docheva. Deposition of Copper Oxide, Titanium Oxide and Indium Tin Oxide Films by Reactive Magnetron Sputtering.// Vacuum, 1991, No 1/2, pp. 53-55
статия Popov, D., Uzunov, Ts., Pencheva, T., Docheva, P. Oxidation-induced changes in the optical transmittance of thin films deposited by magnetron sputtering of stainless steel.// Thin Solid Films, 1986, No 1, Vol. 135, pp. 129-135, ISSN ISSN: 00406090.
статия Vassilev G, B. Arnaudov, P. Docheva, N. Nancheva, M. Balcheva. CuInSe2 – Alternative Material for Solar Energy Conversion.// Annuaire de l’Universite de Sofia “St. Kliment Ohridski” Faculte de Chemie, 2000, No 92-94, pp. 207-210
статия Vassilev G., P. Docheva, N. Nancheva, B. Arnaudov, I. Dermendjiev. Technology and properties of magnetron sputtered CuInSe2 layers.// Materials Chemistry and Physics, 2003, No 3, pp. 905-910
статия Vassilev G., V. Gandova, P. Docheva,. Comments and reconciliation of the Ni–Bi-system thermodynamic reassessments.// Cryst. Res. Technol., 2009, No 1, pp. 25-30
статия Zlatev P., P. Docheva, J. Blanco, D. Alarcon. Efficiency Comparison of CPC Solar Collectors and a New Type of Flat-Plate Solar Collector with Liquid Absorber.// The IHP programme. Research Result at Plataforma Solar de Almeria within the Year 2003 Access Campaign 2003, 2004, No 1, pp. 35-42, ISSN 84-7834-474-8.
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Системата е разработена по проект 2012-РУ-05, финансиран от фонд НИ, и се поддържа от катедра „Компютърни системи и технологии”.